In response to the growing number of applications for electromechanical imaging and spectroscopy, Asylum Research offers the Piezo Force Module, which enables very-high-sensitivity, high-bias, and ...
In the LED, semi-conductor, automotive and medical sectors, surface metrology and characterization is an important criterion to ensure product performance in a wide range of applications. These ...
A Photoconductive Atomic Force Microscopy (pcAFM) module is now available for the Bruker Dimension Icon platform. The module enables sample illumination while performing nanoscale electrical ...
(Nanowerk Application Note) Surface metrology and characterization is ever more critical for overall product performance in wide ranging applications across the semi-conductor, LED, data storage, ...
Typically, nanometer-scale electrical characterization is done by AFM-based conductivity measurements. Conductive AFM (CAFM) for high current ranges and tunnelling AFM (TUNA) for lower current range ...
The Australian Research Council Centre of Excellence in Plant Cell Walls is a collaborative project involving the Universities of Adelaide, Melbourne and Queensland in partnership with South Australia ...
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