Space Associates, Inc., a provider of advanced metrology and inspection solutions, announced new machine learning capabilities for its kSA Glass Breakage & Defect Detection tool. The enhancement adds ...

AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...