Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
Part two explains the workings of the JTAG boundary-scan technology. Part four explains how to use breakpoints, event triggers, and program traces to debug code. Emulation is a technology used in the ...
In integrating its LDRA software-test tool suite with Lauterbach’s TRACE32 debugger, LDRA gives TRACE32 users a host of software-testing features, including traceability, verification, and code and ...
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